Enrique Carbo-Argibay

    International Iberian Nanotechnology Laboratory

    Areas of Interest: Electron Microscopy, Atomic Scale Characterization, Fuel Cells, Batteries, Catalysts, 2D Materials

    Name Enrique Carbo-Argibay
    Role Researcher – Electron Microscopy Facility Manager
    Institution International Iberian Nanotechnology Laboratory (INL)
    Contact enrique.carbo@inl.int
    Key Words / Areas of Interest Electron Microscopy, Atomic Scale Characterization, Fuel Cells, Batteries, Catalysts, 2D Materials
    Expertise Sought Our research is focused on understanding the structure and chemical composition of materials by using electron microscopy techniques (Imaging and Spectroscopy). We aim to correlate that atomic scale structure/composition with the macroscopic properties/features of the materials by means of the use of the following techniques: AC-STEM, AC-TEM, EELS, EDX, Electron Diffraction, Tomography, EFTEM, Cryo-TEM, Lorentz, Holography and/or in-situ. In view of the aforementioned, we are looking for researchers working on Batteries, Fuel Cells, Catalysts, 2D Materials and Nanoparticles and for whom the characterization of their materials by advanced electron microscopy techniques would shed light on the properties of that material.

     

    Bio:

    Enrique Carbo-Argibay is currently a Researcher and Electron Microscopy Facility Manager at International Iberian Nanotechnology Laboratory (INL) in Braga, Portugal. He has a Ph.D. in Physical Chemistry from the University of Vigo (Spain), where he worked on the synthesis, structural characterization and optical properties of plasmonic nanoparticles. After his Ph.D., Enrique joined INL in 2013 as postdoctoral researcher to work on the synthesis and electron microscopy characterization of nanomaterials. Subsequently, he focused his research on understanding the structure and chemical composition of doped 2D materials, by using aberration-corrected TEM/STEM coupled with EELS and EDS techniques. As Electron Microscopy Facility Manager, he has gained extensive experience in numerous electron microscopy techniques (AC-STEM, AC-TEM, EELS, EDX, Electron Diffraction, Tomography, EFTEM, Cryo-TEM, Lorentz, Holography or/and in-situ) as well as in sample preparation (including FIB-SEM). He is co-author of more than 40 publications in international peer reviewed journals and 1 book chapter: https://scholar.google.es/citations?user=VSbjb8IAAAAJ&hl=en